Abstract

At the present time the need to produce full grain and aniline leathers has brought about a greater awareness of grain blemishes and faults. Such faults can originate during the life of the animal, or during cure, or during tannery processing. This paper describes how the microscope, and in particular the scanning electron microscope, is used at BLMRA to identify the cause of grain fault. The illustrations cover a wide variety of faults.